The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Sep. 17, 2015
Applicant:

Elbit Systems of America, Llc, Fort Worth, TX (US);

Inventors:

Marko Labudovic, Fort Worth, TX (US);

Jeremie Jackson, Fort Worth, TX (US);

Martin Cielinski, Fort Worth, TX (US);

Michael M. Tilleman, Fort Worth, TX (US);

Assignee:

Elbit Systems of America, LLC, Fort Worth, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01);
Abstract

A method for detecting light sources. The method includes capturing an image including a sub-infrared light emitter, applying a filter to a pixel of the captured image to isolate a signal strength of a range of frequencies, and comparing the signal strength of the filtered pixel to an expected signal strength of a background spectra for the range of frequencies. As a result of a difference between the signal strength of the filtered pixel and the expected signal strength exceeding a predetermined threshold, the method includes identifying the pixel as corresponding to a light emitter. As a result of the difference between the signal strength of the filtered pixel and the expected signal strength not a predetermined threshold, the method includes identifying the pixel as not corresponding to a light emitter.


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