The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Nov. 23, 2015
Applicant:

W2bi, Inc., South Plainfield, NJ (US);

Inventors:

Derek Diperna, Medford Lakes, NJ (US);

Ira Leventhal, San Jose, CA (US);

Keith Schaub, Austin, TX (US);

Artun Kutchuk, San Jose, CA (US);

Assignee:

W2BI, INC., South Plainfield, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04B 17/16 (2015.01); G05B 19/418 (2006.01); H04W 4/80 (2018.01); G06F 3/0346 (2013.01); H04M 1/04 (2006.01); H04N 7/18 (2006.01); H04W 4/02 (2018.01); H04W 24/02 (2009.01); G06F 11/22 (2006.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01); H04B 17/29 (2015.01); B25J 9/16 (2006.01); H02J 7/02 (2016.01); H04M 1/24 (2006.01); H04W 84/12 (2009.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04B 17/16 (2015.01); B25J 9/1679 (2013.01); G05B 19/41875 (2013.01); G06F 3/0346 (2013.01); G06F 11/2221 (2013.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01); H04B 17/29 (2015.01); H04M 1/04 (2013.01); H04N 7/18 (2013.01); H04W 4/02 (2013.01); H04W 4/80 (2018.02); H04W 24/02 (2013.01); G05B 2219/32368 (2013.01); G05B 2219/37021 (2013.01); G05B 2219/37022 (2013.01); G05B 2219/37231 (2013.01); G05B 2219/37388 (2013.01); G05B 2219/37431 (2013.01); G05B 2219/37433 (2013.01); G05B 2219/37634 (2013.01); G05B 2219/40041 (2013.01); G05B 2219/45089 (2013.01); H02J 7/025 (2013.01); H04M 1/24 (2013.01); H04W 24/06 (2013.01); H04W 84/12 (2013.01);
Abstract

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.


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