The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Apr. 25, 2012
Applicants:

Saravjeet Singh, Santa Clara, CA (US);

Graeme Jamieson Scott, Sunnyvale, CA (US);

Amitabh Sabharwal, San Jose, CA (US);

Ajay Kumar, Cupertino, CA (US);

Inventors:

Saravjeet Singh, Santa Clara, CA (US);

Graeme Jamieson Scott, Sunnyvale, CA (US);

Amitabh Sabharwal, San Jose, CA (US);

Ajay Kumar, Cupertino, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32082 (2013.01); H01J 37/321 (2013.01); H01J 37/32477 (2013.01); H01J 37/32623 (2013.01); H01J 37/32642 (2013.01); H01J 37/32651 (2013.01);
Abstract

Embodiments of the present invention generally relate to a method and apparatus for plasma etching substrates and, more specifically, to a method and apparatus with protection for edges, sides and backs of the substrates being processed. Embodiments of the present invention provide an edge protection plate with an aperture smaller in size than a substrate being processed, wherein the edge protection plate may be positioned in close proximity to the substrate in a plasma chamber. The edge protection plate overlaps edges and/or sides on the substrate to provide protection to reflective coatings on the edge, sides, and back of the substrate.


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