The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Mar. 07, 2016
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G01N 15/14 (2006.01); G01N 33/49 (2006.01); G06K 9/52 (2006.01); G06K 9/62 (2006.01); G06T 7/73 (2017.01); C12M 1/34 (2006.01); G01N 15/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 15/1468 (2013.01); G01N 33/49 (2013.01); G06K 9/00127 (2013.01); G06K 9/52 (2013.01); G06K 9/6267 (2013.01); G06T 7/73 (2017.01); C12M 41/36 (2013.01); G01N 2015/0073 (2013.01); G01N 2015/1486 (2013.01); G06K 2009/4666 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30242 (2013.01);
Abstract
An image processing apparatus includes a number-of-target-cells estimating unit for estimating, on the basis of a feature of a target sample, the number of target cells included in the target sample, and a detection parameter setting unit for setting, on the basis of the estimated number of target cells, a detection parameter regarding a process of detecting target cells in a captured image of the target sample.