The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Jul. 31, 2017
Noporvis Co., Ltd., Kaohsiung, TW;
NOPORVIS CO., LTD., Kaohsiung, TW;
Abstract
An image inspection device includes a rotating platform configured to carry a workpiece; a first image capturing device configured to capture a top-view image of the workpiece; a second image capturing device configured to capture a lateral-view image of the workpiece; a storage unit configured to pre-store a plurality of lateral-view images of a standard workpiece from different angles; and a processing unit. The processing unit controls the rotating platform to rotate the workpiece to a first angle and a second angle according to the top-view image. The processing unit is configured to generate a first comparison result and a second comparison result by comparing the lateral-view images of the workpiece with lateral-view images of the standard workpiece from, respectively, the first angle and the second angle, and determine whether the workpiece has a defect according to the first comparison result and the second comparison result.