The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Apr. 13, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Ordos Yuansheng Optoelectronics Co., Ltd., Ordos, Inner Mongolia, CN;
Zhiqiang Wang, Beijing, CN;
Puguo Zhang, Beijing, CN;
Litao Yang, Beijing, CN;
Yanwei Ren, Beijing, CN;
Kunpeng Zhang, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Ordos Yuansheng Optoelectronics Co., Ltd., Ordos, Inner Mongolia, CN;
Abstract
The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.