The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Apr. 14, 2015
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Liran Goshen, Pardes-Hanna, IL;

Asher Gringauz, Nesher, IL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20028 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method includes obtaining original image data and obtaining de-noised image data, wherein the de-noised image data is the original image data after de-noising the original image data. The method further includes determining a noise pattern for the original image data. The method further includes estimating underlying local structure from the original image data based on the noise pattern. The method further includes restoring low contrast structure that is lost during the de-noising of the original image data to the de-noised image data based on the estimated underlying local structure by adding the estimated underlying local structure to the de-noise imaged data, generating low contrast structure enhanced de-noised image data.


Find Patent Forward Citations

Loading…