The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Dec. 16, 2016
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Yung-Hsin Chien, Apex, NC (US);

Pu Wang, Charlotte, NC (US);

Yue Li, Raleigh, NC (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06N 5/04 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 17/30598 (2013.01); G06N 5/04 (2013.01); G06F 2216/03 (2013.01);
Abstract

Systems and methods are provided for performing data mining and statistical learning techniques on a big data set. More specifically, systems and methods are provided for linear regression using safe screening techniques. Techniques may include receiving a plurality of time series included in a prediction hierarchy for performing statistical learning to develop an improved prediction hierarchy. It may include pre-processing data associated with each of the plurality of time series, wherein the pre-processing includes tasks performed in parallel using a grid-enabled computing environment. For each time series, the system may determine a classification for the individual time series, a pattern group for the individual time series, and a level of the prediction hierarchy at which the each individual time series comprises an need output amount greater than a threshold amount. The computing system may generate an additional prediction hierarchy using the first prediction hierarchy, the classification, the pattern group, and the level.


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