The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Dec. 19, 2014
Amazon Technologies, Inc., Seattle, WA (US);
Xiaofeng Ren, Yarrow Point, WA (US);
Avishkar Misra, Redmond, WA (US);
Ohil Krishnamurthy Manyam, Bellevue, WA (US);
Liefeng Bo, Seattle, WA (US);
Sudarshan Narasimha Raghavan, Snoqualmie, WA (US);
Christopher Robert Towers, Seattle, WA (US);
Gopi Prashanth Gopal, Redmond, WA (US);
Yasser Baseer Asmi, Redmond, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Described is a system for counting stacked items using image analysis. In one implementation, an image of an inventory location with stacked items is obtained and processed to determine the number of items stacked at the inventory location. In some instances, the item closest to the camera that obtains the image may be the only item viewable in the image. Using image analysis, such as depth mapping or Histogram of Oriented Gradients (HOG) algorithms, the distance of the item from the camera and the shelf of the inventory location can be determined. Using this information, and known dimension information for the item, a count of the number of items stacked at an inventory location may be determined.