The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10169418 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2019

Filed:

Sep. 24, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hima P. Karanam, New Delhi, IN;

Albert Maier, Tuebingen, DE;

Marvin Mendelssohn, Cambridge, MA (US);

Heather Stimpson, Cambridge, MA (US);

Dan Dan Zheng, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30489 (2013.01);
Abstract

Methods, systems, and computer program products for deriving a multi-pass matching algorithm for data de-duplication are provided herein. A method includes identifying multiple passes across multiple databases using a set of one or more blocking columns derived from a set of trained input data; identifying, in each of the multiple passes, one or more columns across the multiple databases that match one or more of the blocking columns; selecting a given pass from the multiple passes, wherein said given pass comprises a maximum number of matching columns within the multiple passes; determining, for the given pass, data that conform to the given pass comprising (i) a set of matching columns, (ii) one or more matching types and (iii) one or more weights; and determining one or more subsequent passes across the multiple databases iteratively by removing the data that conform to the given pass.


Find Patent Forward Citations

Loading…