The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Apr. 23, 2015
International Business Machines Corporation, Armonk, NY (US);
Lukasz Gaza, Jankowice, PL;
Artur M. Gruszecki, Cracow, PL;
Tomasz Kazalski, Cracow, PL;
Konrad K. Skibski, Zielonki, PL;
Tomasz Stradomski, Bedzin, PL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method of estimating selectivity of a query may include generating, for data stored in a database in a memory, a one-dimensional value distribution for each of a plurality of attributes of the data. A multidimensional histogram may be generated, wherein the multidimensional histogram includes the one-dimensional value distributions for the plurality of attributes of the data. The multidimensional histogram may be converted to a one-dimensional histogram by assigning each bucket of the multidimensional histogram to corresponding buckets of the one-dimensional histogram and ordering the corresponding buckets according to a space-filling curve. One or more bucket ranges of the one-dimensional histogram may be determined by mapping the query conditions on the one-dimensional histogram. The selectivity of the query may be estimated by estimating how many data values in the one or more bucket ranges will meet the query conditions.