The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Dec. 06, 2016
International Business Machines Corporation, Armonk, NY (US);
Darren R. Beard, Hampshire, GB;
Jenny J. He, Hampshire, GB;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Method and system are provided for automated system testing in a complex software environment. The method includes: collecting data during a test run of a product under test that involves multiple systems and resources where a test run introduces one or more product code change sets, the collected data including a product trace of the execution of the product under test at a product code level; and storing the last good collected data. Based on the test failing, comparing a current product trace with a last good product trace; determining a difference between the current and last good traces and identifying a failing product program referenced in the product trace; looking through the introduced product code change sets to determine if a code change is found for the failing program indicating that the error is likely to be in the code change set, and generating an appropriate defect prompt.