The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Mar. 22, 2018
International Business Machines Corporation, Armonk, NY (US);
Arunachalam Jayaraman, Chennai, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, computer program product, and system for dynamic relational integrated intelligent monitoring and problem resolution of systems is provided. An IT environment is monitored for a first symptom. The first symptom is a malfunction of at least one component of a plurality of components. In response to determining a first measurement deviates from a reference value, a first component is determined to be the cause component. In response to determining a monitoring tier of the cause component is activated, a plurality of measurements is determined for the plurality of components. A component with the greatest number of activated monitoring tiers is identified and compared to the cause component. Probe data for the plurality of components is collected. A probe ripple is determined, based on one or more components affected by the malfunction. A root cause of the first symptom is reported.