The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Mar. 02, 2018
Uptake Technologies, Inc., Chicago, IL (US);
Aparna Pandey, Chicago, IL (US);
Nelson Troy de Fritas, Chicago, IL (US);
Uptake Technologies, Inc., Chicago, IL (US);
Abstract
A computing system may be configured to monitor the operation of a plurality of nodes in a manufacturing network that comprises a plurality of edge nodes, a plurality of intermediate nodes, and a root node. While monitoring the operation of the plurality of nodes, the computing system may identify a given time at which at least one node in the manufacturing network satisfies node-level threshold criteria indicating anomalous operation of the node and responsively evaluate the operation of the manufacturing network at the given time using one or more of macro-level threshold, micro-level threshold criteria, path-level threshold criteria, and node-level threshold criteria. Based on the evaluation, the computing system may identify an anomaly in the manufacturing network at the given time and then cause a client station to present an alert indicating the anomaly.