The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Feb. 17, 2017
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventors:
Yusuke Amano, Tokyo, JP;
Susumu Honda, Kanagawa, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 27/00 (2006.01); G02B 21/08 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/002 (2013.01); G02B 21/08 (2013.01); G02B 21/26 (2013.01); G02B 27/0018 (2013.01);
Abstract
Provided is a laser scanning microscope including a stage on which a sample is placed, an objective lens that is disposed below the stage and that focuses laser light from a light source onto the sample, a scanner that scans the laser light focused by the objective lens over the sample, a condenser lens disposed opposite the objective lens with the stage interposed therebetween, and a light blocking cover that is disposed in an optical path between the condenser lens and the stage and that blocks external light entering the objective lens or the condenser lens from above the sample via the stage.