The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Oct. 18, 2016
Hitachi Kokusai Electric Inc., Tokyo, JP;
Kiyotaka Kogo, Tokyo, JP;
HITACHI KOKUSAI ELECTRIC INC., Tokyo, JP;
Abstract
An imaging apparatus includes an AF evaluation value calculation unit for calculating an AF evaluation value by integrating a focus differential signal value. The AF evaluation value calculation unit includes a high luminance region determination unit for extracting a feature of each pixel value and determining whether or not the feature is a backlight scene in a dark place, and a band determination unit for determining a band of a contour component of a subject. A focus differential signal value on a low luminance region side in a contour component formed by a boundary between a high luminance region and a low luminance region due to backlighting is excluded from the integration, and the AF evaluation value is calculated using only a focus differential signal value on the high luminance region side in the contour component of the subject to be focused as an object for the integration.