The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Sep. 13, 2017
Applicant:

Siemens Medical Solutions Usa, Inc., Malvern, PA (US);

Inventors:

Mehmet Aykac, Knoxville, TN (US);

Vladimir Y. Panin, Knoxville, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01T 7/00 (2006.01); G01T 1/202 (2006.01); G01T 1/164 (2006.01); G01T 3/00 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G01T 1/1648 (2013.01); G01T 1/202 (2013.01); G01T 3/001 (2013.01);
Abstract

A method of scanner correction includes obtaining a first photopeak location for a first crystal in a detector. Image data is received from the first crystal. The first crystal generates the image data during a current imaging procedure. The image data is processed using the first photopeak location. A second photopeak location is determined for the first crystal from the image data. A difference between the first photopeak location and the second photopeak location of the first crystal is determined and the image data is reprocessed using the second photopeak location when the difference between the first photopeak location and the second photopeak location exceeds a predetermined threshold. An image is generated using the image data.


Find Patent Forward Citations

Loading…