The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Jan. 13, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

George Antony, Cochin, IN;

Mary P. Kusko, Hopewell Junction, NY (US);

Sridhar H. Rangarajan, Bangalore, IN;

Shrinivas Shenoy, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G01R 31/3177 (2013.01); G01R 31/31707 (2013.01);
Abstract

A method, executed by a computer, includes receiving a scan chain design comprising a plurality of parallel scan chains, each parallel scan chain comprising one or more serially connected single-bit registers, each parallel scan chain having a scan chain length. The plurality of parallel scan chains are interspersed with a plurality of stumpmuxes that enable access to the plurality of parallel scan chains and segment each parallel scan chain into a plurality of scan chain segments. The method further includes conducting a determining operation comprising determining a parallel scan chain having a longest scan chain length, and conducting a swapping operation comprising swapping scan chain segments attached to a selected stumpmux to reduce the longest scan chain length and produce an updated scan chain design. A computer system and computer product corresponding to the above method are also disclosed herein.


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