The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Sep. 13, 2017
Mstar Semiconductor, Inc., Hsinchu Hsien, TW;
Wen cai Lu, Shanghai, CN;
Hu Xiao, Shanghai, CN;
MSTAR SEMICONDUCTOR, INC., Hsinchu Hsien, TW;
Abstract
An eye pattern measurement apparatus includes: an eye pattern monitoring device, performing first sampling on a data signal by sequentially using scan clock signals having different phases to obtain a plurality of scan data signals; and a data aligning device, connected to the eye pattern monitoring device, receiving the scan data signals outputted by the eye pattern monitoring device, performing phase-shift on the first clock signal to generate a synchronization clock signal, synchronizing the scan data signals with the synchronization clock signal, and outputting the synchronized scan data signals.