The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Jul. 18, 2016
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventor:

Mohsen H. Mardi, Saratoga, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06K 7/14 (2006.01); B25J 9/16 (2006.01); B25J 9/00 (2006.01); B25J 11/00 (2006.01); B25J 21/00 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2893 (2013.01); B25J 9/0096 (2013.01); B25J 9/1664 (2013.01); B25J 11/0095 (2013.01); B25J 21/00 (2013.01); G06K 7/10297 (2013.01); G06K 7/1413 (2013.01); Y10S 901/09 (2013.01);
Abstract

A chip package assembly testing system and method for testing a chip package assembly are provided herein. In one example, the testing system includes a robot disposed in an enclosure and having a range of motion operable to transfer a chip package assembly between any of a first queuing station, a second queuing station and a plurality of test stations. The system also includes an automatic identification and data capture (AIDC) device operable to read an identification tag affixed to a carrier disposed in the first and second queuing stations, and a controller configured to control placement of chip package assemblies by the robot in response information obtained from a carrier disposed in at least one of the first and second queuing stations, the predefined test routine of the test processor of the first test station, and the predefined test routine of the test processor of the second test station.


Find Patent Forward Citations

Mardi, Mohsen. (2019). Modular testing system with versatile robot (U.S. Patent No. 10168384). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10168384

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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