The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Apr. 04, 2017
Pacific Aerospace & Electronics, Inc., Wenatchee, WA (US);
Hua Xia, Huffman, TX (US);
Tucker Havekost, Leavenworth, WA (US);
Daniel Brown, Wenatchee, WA (US);
Erich Preissler, Wenatchee, WA (US);
Mike Grimm, Wenatchee, WA (US);
PA&E, HERMETIC SOLUTIONS GROUP, LLC, Wenatchee, WA (US);
Abstract
A system for determining the impact of moisture on a dielectric sealing material may include a testing apparatus having a testing chamber. A dielectric sealing material and a conducting pin may be exposed to the testing chamber. A first electrical lead may be coupled to the conducting pin, and a second electrical lead may be coupled to the dialectic material. An insulation resistance measurement unit may be coupled to both the first electrical lead and the second electrical lead, and the insulation resistance measurement unit may be configured to measure an insulation resistance value between the electrical leads. The insulation resistance measurement unit may measure a first insulation resistance value of the dielectric sealing material in a first environmental condition, and the insulation resistance measurement unit may measure a second insulation resistance value of the dielectric sealing material at a second environmental condition, that is different than the first environmental condition.