The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Mar. 15, 2014
Applicant:

The Translational Genomics Research Institute, Phoenix, AZ (US);

Inventor:

Kendall Van Keuren-Jensen, Phoenix, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); G01N 33/68 (2006.01); C12Q 1/6883 (2018.01);
U.S. Cl.
CPC ...
G01N 33/6896 (2013.01); C12Q 1/6883 (2013.01); C12Q 2600/112 (2013.01); C12Q 2600/118 (2013.01); C12Q 2600/158 (2013.01); G01N 2800/28 (2013.01); G01N 2800/2878 (2013.01); G01N 2800/50 (2013.01); G01N 2800/56 (2013.01);
Abstract

The present invention is directed to systems and methods for diagnosing amyotrophic lateral sclerosis (ALS) by assessing the expression level of a marker, FGGY. In other aspects, the present invention is also directed to systems and methods of establishing a prognosis of ALS disease severity by assessing the expression level of FGGY.


Find Patent Forward Citations

Van Keuren-Jensen, Kendall. (2019). Methods for the diagnosis of amyotrophic lateral sclerosis (U.S. Patent No. 10168340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10168340

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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