The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Dec. 01, 2014
Horiba Instruments Incorporated, Irvine, CA (US);
Adam Matthew Gilmore, Flemington, NJ (US);
Xiaomei May Tong, Edison, NJ (US);
HORIBA INSTRUMENTS INCORPORATED, Irvine, CA (US);
Abstract
A system or method for analyzing a sample include an input light source, an excitation light source positioned to receive light from the input light source and to sequentially illuminate the sample with each of a plurality of wavelengths, a fluorescence detector positioned to receive and substantially simultaneously detect multiple wavelengths of light emitted by the sample for each of the plurality of excitation wavelengths, an absorption detector positioned to receive and detect light passing through the sample, and a computer in communication with the excitation light source, the fluorescence detector, and the absorption detector, the computer controlling the excitation light source to sequentially illuminate the sample with each of the plurality of wavelengths while measuring absorption and fluorescence of the sample based on signals received from the fluorescence and absorption detectors.