The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
May. 07, 2014
Applicant:
Siemens Aktiengesellschaft, München, DE;
Inventors:
Rainer Böhm, Rietz-Neuendorf, DE;
Karl Fendt, München, DE;
Werner Heinrich, Oberkrämer OT Bärenklau, DE;
Hubert Mooshofer, München, DE;
Assignee:
SIEMENS AKTIENGESELLSCHAFT, , DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/04 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
G01N 29/069 (2013.01); G01N 29/043 (2013.01); G01S 15/8997 (2013.01);
Abstract
A method and a device for defect-size evaluation of defects in a test object in ultrasonic testing is provided. In particular, the method and device also allows systematic determination of defect sizes based on the SAFT method. This is done by simulating defects in a test object on the basis of a defined test scenario, and comparing these simulations with actually recorded measured values.