The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Jul. 05, 2016
Applicant:

Netzsch-gerätebau Gmbh, Selb, DE;

Inventors:

Elena Moukhina, Selb, DE;

Doreen Rapp, Schönwald, DE;

Markus Meyer, Ehingen, DE;

Thilo Hilpert, Selb, DE;

Martin Hager, Weissenstadt, DE;

Fabian Wohlfahrt, Rehau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/16 (2006.01);
U.S. Cl.
CPC ...
G01N 25/16 (2013.01);
Abstract

A method for the thermomechanical analysis of a sample (P) of a material including (a) controlling the temperature of the sample (P), (b) recording data representative for a length variation (dL) of the sample (P), (c) evaluating the data in order to determine a reversible component (dL), (d) calculating a corrected reversible component (dL; α) and/or of the coefficient of thermal expansion (α).


Find Patent Forward Citations

Moukhina, Elena. (2019). Method and apparatus for the thermomechanical analysis of a sample (U.S. Patent No. 10168291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10168291

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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