The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Jun. 02, 2017
Applicant:
Hinds Instruments, Inc., Hillsboro, OR (US);
Inventors:
John Freudenthal, Hillsboro, OR (US);
Andy Leadbetter, Hillsboro, OR (US);
Baoliang Wang, Portland, OR (US);
Assignee:
Hinds Instrumsnts, Inc., Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/23 (2006.01); G01J 4/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/23 (2013.01); G01J 4/00 (2013.01); G01N 21/21 (2013.01); G01N 2201/0621 (2013.01); G01N 2201/0683 (2013.01);
Abstract
This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.