The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Jan. 27, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Satoshi Tanabe, Meguro, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01J 11/00 (2006.01); G01J 1/02 (2006.01); A61B 5/024 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 11/00 (2013.01); A61B 5/024 (2013.01); A61B 5/7257 (2013.01); G01J 1/0228 (2013.01); A61B 5/0002 (2013.01); A61B 5/02416 (2013.01);
Abstract

An apparatus for controlling a frequency analysis processing includes: a memory; and a processor coupled to the memory and configured to execute a fast Fourier transform process that includes performing a fast Fourier transform operation on data of two groups into which sensor data sensed at a first sampling frequency by a sensor is divided, and execute a change process that includes changing, in a case where results of butterfly operations of the fast Fourier transform operation are similar between the two groups, a sampling frequency at which the sensor operates to a second sampling frequency lower than the first sampling frequency.


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