The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Mar. 05, 2018
Takayuki Gotoh, Kanagawa, JP;
Takuroh Sone, Kanagawa, JP;
Akihiro Iwamatsu, Ibaraki, JP;
Hideyuki Kihara, Kanagawa, JP;
Takashi Soma, Kanagawa, JP;
Shuhei Watanabe, Chiba, JP;
Takayuki Gotoh, Kanagawa, JP;
Takuroh Sone, Kanagawa, JP;
Akihiro Iwamatsu, Ibaraki, JP;
Hideyuki Kihara, Kanagawa, JP;
Takashi Soma, Kanagawa, JP;
Shuhei Watanabe, Chiba, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A color measurement apparatus includes at least one illuminator, an imager, and circuitry. The circuitry is configured to normalize each pixel included in an imaging region of one of the spectral reflectance images of the measurement target irradiated with light at a specific illumination angle of the plurality of illumination angles, with one of the spectral reflectance images of the reference object irradiated with light at the specific illumination angle, for each of the plurality of illumination angles so as to generate normalized spectral reflectance images of the measurement target. The circuitry further calculates a numerical value of at least one color for each pixel of the normalized spectral reflectance images of the measurement target, for respective ones of the plurality of illumination angles, to measure color of the surface of the measurement target.