The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Apr. 28, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Masakazu Tohara, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A three dimensional shape measurement apparatus comprising: a projection unit configured to perform a projection operation to a measurement area; a photographing unit configured to photograph a target object in the measurement area undergoing the projection operation; and a measurement unit configured to measure a three dimensional shape of the target object based on the photographed image, wherein the measurement area includes a measurement reference surface serving as a reference for a focus position of a photographing optical system of the photographing unit, and is defined based on a projection range of the projection unit and a photographing range of the photographing unit, and the focus position is set deeper than a position of the measurement reference surface when observed from the photographing unit.