The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

May. 30, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Rintaro Nishihara, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/64 (2006.01); H04N 5/232 (2006.01); H04N 5/14 (2006.01); H04N 5/217 (2011.01); G06T 7/207 (2017.01); G09G 3/36 (2006.01); G02F 1/1333 (2006.01); G02B 7/02 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23248 (2013.01); G02B 27/646 (2013.01); H04N 5/144 (2013.01); H04N 5/217 (2013.01); G02B 7/023 (2013.01); G02F 1/1333 (2013.01); G06T 7/207 (2017.01); G06T 2207/30241 (2013.01); G09G 3/3607 (2013.01); H04N 5/23277 (2013.01);
Abstract

An image stabilization device includes a movable portion including an image pickup lens and a VCM driving portion configured to drive the movable portion relative to a fixed portion, the image stabilization device including: a position detection element arranged on the movable portion; and paired position detection magnets arranged at positions facing the position detection element and arranged on the fixed portion; wherein the paired position detection magnets are a first magnet and a second magnet arranged so that different magnetic poles face a surface of the position detection element; the first magnet and the second magnet are arranged in order along a direction away from an optical axis of a light flux incident on the image pickup lens; and magnitudes of densities of magnetic fluxes reaching the surface of the position detection element from the first magnet and the second magnet, respectively, are mutually different.


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