The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Jun. 07, 2016
Applicant:

Kookmin University Industry Academy Cooperation Foundation, Seoul, KR;

Inventors:

Byungjun Jang, Seoul, KR;

Jinsoo Park, Seoul, KR;

Hyungoo Yoon, Gimpo-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04J 1/12 (2006.01); H04L 5/00 (2006.01); H04L 12/26 (2006.01); H04L 27/00 (2006.01); H04W 16/14 (2009.01); H04W 24/00 (2009.01);
U.S. Cl.
CPC ...
H04L 41/145 (2013.01); H04J 1/12 (2013.01); H04L 5/001 (2013.01); H04L 5/0051 (2013.01); H04L 5/0073 (2013.01); H04L 27/0006 (2013.01); H04L 43/08 (2013.01); H04L 43/50 (2013.01); H04W 16/14 (2013.01); H04W 24/00 (2013.01); H04L 5/0069 (2013.01);
Abstract

An approach is provided for configuring multiple interferers. An interference effect minimum protective distance is calculated in response to detection of an input of an interferer parameter. Physical (PHY) layer modeling is performed to individually apply a pathloss caused by a separation distance between an interferer node and a victim and apply a pathloss of each node to an attenuator and a transmitter amplifier in an HW manner. MAC layer modeling is performed to determine a transmission node and a transmission time using Markov chain or determine a transmission node and a transmission time using a result log file of an external MAC simulator and a transmission/reception time is reflected in an HW manner by turning ON/OFF a switch. Multiple correlated interferer signals are generated for analyzing an effect of frequency interference in view of both of PHY and MAC layers.


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