The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jun. 18, 2018
Inphi Corporation, Santa Clara, CA (US);
Damian Alfonso Morero, Santa Clara, CA (US);
Martin Carlos Asinari, Santa Clara, CA (US);
Martin Ignacio Del Barco, Santa Clara, CA (US);
Mario Rafael Hueda, Santa Clara, CA (US);
Lucas Javier Yoaquino, Santa Clara, CA (US);
INPHI CORPORATION, Santa Clara, CA (US);
Abstract
An adaptive demapper adaptively demaps an input symbol. An input symbol is received and demapped in a hard-output demapper to generate a current detected symbol corresponding to a constellation point on a current constellation closest to the input symbol. A corrected inverse of a current noise power estimate is determined by updating a previous noise power estimate based on a difference between the input symbol and the current detected symbol. In a soft-output demapper, a log likelihood ratio corresponding to the current detected symbol is determined based on the corrected inverse of the current noise power estimate. The constellation point in the current constellation corresponding to the current detected symbol is then updated to generate an updated constellation based on a difference between the constellation point and the received input symbol.