The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Oct. 23, 2014
Applicant:

Leco Corporation, St. Joseph, MI (US);

Inventors:

Anatoly N. Verenchikov, St. Petersburg, RU;

Mikhail I. Yavor, St. Petersburg, RU;

Assignee:

LECO Corporation, St. Joseph, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/406 (2013.01); H01J 49/067 (2013.01);
Abstract

A multi-reflecting time-of-flight mass spectrometer comprises a pair of parallel aligned ion mirrors and a set of periodic lenses for confining ion packets along the drift z-direction. To compensate for time-of-flight spherical aberrations T|zz created by the periodic lenses, at least one set of electrodes are disposed within the apparatus, forming an accelerating or reflecting electrostatic fields which are curved in the z-direction in order to form local negative T|zz aberration. The structure may be formed within an accelerator, within flinging fields or intentionally and locally curved fields of ion mirrors, within electrostatic sector interface, or at curved surface of ion to electron converter at the detector.


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