The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Mar. 10, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventors:
Joosung Yun, Asan-si, KR;
Seongseob Shin, Asan-si, KR;
Moon-Ho Lee, Asan-si, KR;
Woonsup Choi, Asan-si, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G01R 31/28 (2006.01); G11C 29/48 (2006.01); H04B 1/30 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56016 (2013.01); G01R 31/2851 (2013.01); G11C 29/48 (2013.01); G11C 29/56012 (2013.01); G11C 2029/5602 (2013.01); H04B 2001/305 (2013.01);
Abstract
A test apparatus includes a device under test (DUT) configured to exchange data using a serial interface protocol and a test controller configured to receive a binary vector corresponding to a physical layer of the serial interface protocol from an external device and to buffer and transmit the received binary vector to the DUT.