The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Nov. 17, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Seung Chul Chae, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01); A61B 5/055 (2006.01); A61B 6/03 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); A61B 8/4254 (2013.01); A61B 8/4416 (2013.01); A61B 8/469 (2013.01); A61B 8/5223 (2013.01); A61B 5/055 (2013.01); A61B 5/7485 (2013.01); A61B 6/032 (2013.01); A61B 8/085 (2013.01); A61B 8/0825 (2013.01);
Abstract

A computer-aided diagnostic (CAD) apparatus and a CAD method based on the diagnostic intention of a user are provided. The CAD apparatus includes a region of interest (ROI) detector configured to detect an ROI from an image input from a probe, and a probe motion determiner configured to determine a motion of the probe in response to the ROI detector detecting the ROI. The CAD apparatus further includes a diagnostic intention determiner configured to determine a diagnostic intention of a user based on the determined motion of the probe, and a diagnostic intention processor configured to perform a diagnostic procedure based on the determined diagnostic intention of the user.


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