The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

May. 25, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui, CN;

Inventors:

Honglin Niu, Beijing, CN;

Xutong Chen, Beijing, CN;

Guangfei Fan, Beijing, CN;

Jinbao Zhang, Beijing, CN;

Bin Wang, Beijing, CN;

Yun Zhu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); B26D 5/00 (2006.01); B29C 55/00 (2006.01); B29L 7/00 (2006.01); B29L 31/34 (2006.01); B29K 105/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6201 (2013.01); B26D 5/007 (2013.01); B29C 55/005 (2013.01); B29K 2105/256 (2013.01); B29K 2995/0005 (2013.01); B29L 2007/008 (2013.01); B29L 2031/3406 (2013.01);
Abstract

An anisotropic conductive film (ACF) cutting calibration system and method are disclosed, and the system includes: a cutter, configured to cut the ACF; an image acquisition device, configured to collect a cutting mark image of the ACF according to a predetermined period; a processing device, configured to compare the cutting mark image with a predetermined image, so as to determine an offset of a cutting mark in the cutting mark image with respect to a cutting mark in the predetermined image; and a drawing device, configured to draw the ACF and adjust a speed of drawing the ACF.


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