The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Sep. 12, 2017
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Garth Jason Simpson, West Lafayette, IN (US);
Ryan Douglas Muir, West Lafayette, IN (US);
David Joseph Kissick, Lemont, IL (US);
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2016.01); G06F 19/00 (2018.01); G01J 1/16 (2006.01); G01J 1/42 (2006.01); G01T 1/17 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G06F 19/707 (2013.01); G01J 1/16 (2013.01); G01J 1/42 (2013.01); G01T 1/17 (2013.01); G01J 2001/442 (2013.01);
Abstract
A method and apparatus for photon, ion or particle counting described that provides seven orders of magnitude of linear dynamic range (LDR) for a single detector. By explicitly considering the log-normal probability distribution in voltage transients as a function of the number of photons, ions or particles present, the binomial distribution of observed counts for a given threshold, the mean number of photons, ions or particles can be determined well beyond the conventional limit.