The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jun. 03, 2015
Hitachi Automotive Systems, Ltd., Hitachinaka-shi, Ibaraki, JP;
HITACHI AUTOMOTIVE SYSTEMS, LTD, Hitachinaka-Shi, JP;
Abstract
A system in which a pass/fail criterion can be expressed using a temporal logic formula when testing object code is provided. The system includes a control content generation part for generating information regarding test execution control content from execution path information retrieved from an object to be inspected, which is object code or an executable file model. The system further includes a pass/fail condition generation part for generating information regarding a pass/fail condition from the execution path information and an inspection formula, including a temporal component, for the object to be inspected. The system also includes a test case generation part for generating a test case having a corresponding pass/fail condition for the inspection formula from the information regarding the test execution control content and the information regarding the pass/fail condition.