The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jan. 06, 2017
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Yasunari Takai, Tokyo, JP;
Katsumi Kawai, Tokyo, JP;
Yusuke Jin, Tokyo, JP;
Ryosuke Tsuchiya, Tokyo, JP;
Ryota Mibe, Tokyo, JP;
Tarou Sakisaka, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to realize a method for analyzing an impact of change with less misidentification and missing, an apparatus for analyzing an impact of change for investigating a change impact range caused by a change in requirements and specifications includes: a storage unit that stores design information and keywords; an input unit that inputs a trace condition including the design information representing an origin of a change impact analysis in design conditions stored in the storage unit and the keywords stored in the storage unit; a CPU that receives the trace condition including the design information representing the origin of the change impact analysis and the keywords from the input unit, and calculates an influence score representing a probability of the influence caused by the change in the requirements and the specifications for each of the design information; and a display unit that outputs a result calculated by the CPU.