The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Jul. 31, 2017
Applicant:

Apex Microelectronics Company Limited, Zhuhai, CN;

Inventor:

Weichen Liu, Zhuhai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 3/12 (2006.01); B41J 2/175 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1235 (2013.01); B41J 2/17546 (2013.01); G06F 3/121 (2013.01); G06F 11/0733 (2013.01); G06F 11/0745 (2013.01); G06F 11/0778 (2013.01); G06F 11/0787 (2013.01); G06F 11/3013 (2013.01); G06F 11/34 (2013.01); G06F 11/3476 (2013.01);
Abstract

The present invention provides a method for recording chip usage state information, a chip of imaging cartridge and an imaging cartridge. The chip of imaging cartridge includes: a substrate, and an information storage unit and a control unit which are provided on the substrate, the information storage unit includes a prioritized writing area and a normal read-write area, the method includes: when the chip receives a read/write operation command sent by an imaging device or when the control unit on the chip monitors a communication interference signal, the control unit on the chip updates a chip service state parameter stored in the prioritized writing area, the chip service state parameter is used for fault analysis of the chip. The chip service state parameter recorded can represent the usage state information of the chip itself, which provides powerful information to find and solve communication problems between the chip and the imaging device.


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