The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Oct. 30, 2017
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

James J. Troy, Issaquah, WA (US);

Scott W. Lea, Renton, WA (US);

Gary E. Georgeson, Tacoma, WA (US);

William P. Motzer, Mount Pleasant, SC (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2006.01); G01S 17/08 (2006.01); G01S 17/88 (2006.01); G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/44 (2006.01); G05B 15/02 (2006.01); H04N 7/18 (2006.01); G01S 17/02 (2006.01); G01S 17/06 (2006.01);
U.S. Cl.
CPC ...
G05D 1/0033 (2013.01); G01N 29/043 (2013.01); G01N 29/0654 (2013.01); G01N 29/4472 (2013.01); G01S 17/08 (2013.01); G01S 17/88 (2013.01); G05B 15/02 (2013.01); G05D 1/0022 (2013.01); H04N 7/185 (2013.01); G01S 17/023 (2013.01); G01S 17/06 (2013.01);
Abstract

Self-contained, remotely operated, mobile measurement and inspection systems for stand-off inspection of large target objects located at sites distant from an operations center. The systems comprise a mobile platform with on-board instrumentation capable of making dimensional measurements in the local coordinate system of the target object. The systems comprise multiple hardware and software components networked to a control interface that enables the operator at the operations center to teleoperate the equipment. Various embodiments include rough-terrain and floatable mobile measurement and inspection systems.


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