The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Sep. 20, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David Monczynski, San Jose, CA (US);

Kaoru Stabnow, Colorado Springs, CO (US);

Jason Yue, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01); G05B 15/02 (2006.01); G05B 19/418 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0428 (2013.01); G05B 15/02 (2013.01); G05B 19/41875 (2013.01); G06F 11/00 (2013.01); G05B 2219/14075 (2013.01); Y02P 90/22 (2015.11);
Abstract

A test case is executed on a product using a hardware machine, the product being configured in manufacturing according to a configuration, the test case being related to an estimation function. A set of data points resulting from the executing is collected. Using the estimation function, an estimated time needed for the executing is computed. Using the set of data points, an actual time used for the executing is computed. A determination is made whether a difference between the estimated time and the actual time is within a tolerance. Responsive to the difference not being within the tolerance, the estimation function is adjusted using the set of data points and at least one other set of data points, the other set of data points being generated by executing the test case on a second product configured according to a second configuration at a previous time.


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