The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Oct. 19, 2017
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventor:

Yoshihisa Tabuchi, Gifu, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G02B 7/02 (2006.01); G02B 7/28 (2006.01); G02B 7/09 (2006.01);
U.S. Cl.
CPC ...
G02B 7/028 (2013.01); G02B 7/09 (2013.01); G02B 7/28 (2013.01); H04N 5/23212 (2013.01);
Abstract

Various embodiments of the present technology may comprise methods and apparatus for focus control in an imaging system. The methods and apparatus may comprise various circuits and/or systems configured to measure the ambient temperature of the lens module and compute a corrected target position based on known thermal characteristics of the lens and/or the lens barrel. Factors used to obtain the corrected target position may comprise the material the of the lens barrel, the thermal time constant of the lens barrel, the linear expansion coefficient of the lens barrel, the effective focal length (EFL) of the lens, the thermal response of the lens, and/or the temperature characteristic coefficient of the EFL.


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