The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Apr. 02, 2015
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Emil Popa, Grenoble, FR;

Veronique Rebuffel, Corenc, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01T 7/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G06T 11/005 (2013.01);
Abstract

The invention relates to a method for linearizing attenuation measurements obtained by means of a direct conversion spectrometer. The spectrometer comprises a radiation source and a detector for detecting said radiation after it has passed through an object. An attenuation measurement is represented by a vector Mgiving the attenuation of the radiation in a plurality Nof energy channels of the detector, said spectrometer being characterized by a response matrix Ψ. Said method estimates, by means of an iterative process, a vector M, called an equivalent linear attenuation vector, giving for each energy channel an attenuation linearly depending on the thickness of the material through which the radiation passes. Said method is applicable to the characterization of the material as well as to the reduction of artifacts in computed tomography.


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