The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Sep. 06, 2013
Applicant:

Rakuten, Inc., Tokyo, JP;

Inventor:

Yasuyuki Hayashi, Tokyo, JP;

Assignee:

Rakuten, Inc., Setagaya-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/00 (2006.01); G01S 15/10 (2006.01); G01S 15/02 (2006.01); G01S 7/527 (2006.01); G01S 15/88 (2006.01);
U.S. Cl.
CPC ...
G01S 15/10 (2013.01); G01S 7/527 (2013.01); G01S 15/025 (2013.01); G01S 15/88 (2013.01);
Abstract

A distance measuring device that can identify a reflected wave by a target object as a measurement target from among reflected waves when the reflected waves are observed in response to one output wave. The device transmits an output wave plural times from a speaker while moving, and acquires waveform data of a sound wave that is received by a microphone every time the output wave is transmitted and includes plural reflected waves caused by reflection of the output wave. Furthermore, the distance measuring device identifies a reflected wave by the target object as the measurement target from among the plural reflected waves according to change in the reception timing of each of the plurality of reflected waves included in each of plural pieces of the acquired waveform data, and calculates the distance to the target object on the basis of the reception timing of the identified reflected wave.


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