The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Sep. 15, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Wolfgang Bielmeier, Erlangen, DE;

Miriam Keil, Erlangen-Dechsendorf, DE;

Joerg Roland, Hemhofen, DE;

Stephan Stoecker, Baiersdorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/54 (2006.01); A61B 5/055 (2006.01); G01R 33/28 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); A61B 5/055 (2013.01); G01R 33/288 (2013.01); G01R 33/4806 (2013.01);
Abstract

In a magnetic resonance apparatus and an operating method therefor in which magnetic resonance data are acquired from a patient, a measurement process is used in which a number of magnetic resonance sequences are carried out sequentially, and a maximum measurement time parameter, describing a maximum possible measurement time for undershooting a threshold value for the overall energy input into the patient during the measurement process, is established, taking into account other known recording parameters of the measurement process. The maximum measurement time parameter is used to restrict the ability of an operator to set a measurement time parameter describing the measurement time as a recording parameter, and/or is used as the measurement time parameter.


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