The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Nov. 10, 2016
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Takashi Inamoto, Kariya, JP;

Masakatsu Horiguchi, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
G01R 31/025 (2013.01); G01R 31/40 (2013.01);
Abstract

A failure inspection system includes a main circuit section, an electrically conductive member, capacitors, a signal generating section, a measurement section and a judgement section. The signal generating section generates a high-frequency AC signal and a low-frequency AC signal. The judgement section determines whether either one of two types of failure has occurred based on the voltage or the current of the high-frequency AC signal. If it is determined that a failure is occurring, the judgment section specifies that which of failures, a leakage current failure or a short-circuit failure, the failure that has occurred is, based on a measurement value of the low-frequency AC signal derived from the measurement section.


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