The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Nov. 06, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Charles Kasimer Sestok, IV, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01); G01R 27/28 (2006.01); G01R 27/14 (2006.01);
U.S. Cl.
CPC ...
G01R 27/28 (2013.01); G01R 27/14 (2013.01);
Abstract

A microcontroller-based system for measuring the impedance of a device under test (DUT) () responsive to a square wave stimulus. A clock generator circuit () in the microcontroller () generates a clock signal at a base clock frequency. A first timer () divides down the base clock frequency by a first frequency divisor integer to set the stimulus frequency of a square wave generated by a general purpose input/output (GPIO) function (), and a second timer () divides down the base clock frequency by a second frequency divisor integer to set the sampling frequency of an analog-to-digital converter (ADC) (). A discrete Fourier transform executed by a processor () is used to determine the impedance of the DUT at the stimulus frequency. The first and second integers are selected so that aliased harmonics fall in different DFT bins from the fundamental tone.


Find Patent Forward Citations

Loading…