The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jun. 04, 2015
Fujifilm Corporation, Tokyo, JP;
Nobuhiko Fujiwara, Ashigarakami-gun, JP;
Noriyuki Kasagi, Ashigarakami-gun, JP;
Toshihito Kimura, Ashigarakami-gun, JP;
Kazuhiro Nakamura, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
To provide a test substance measurement method and a test substance measurement kit adapted to improve the accuracy of the measurement of a test substance. A test substance measurement kit includes: fluorescent particles which are modified with a first binding substance having specific bindability to a test substance; non-fluorescent particles which are modified with a second binding substance having no specific bindability to the test substance; and a substrate on which a first metal film to which a third binding substance having specific bindability to the test substance is fixed, and a second metal film to which a fourth binding substance having no bindability to the test substance, but having bindability to the first binding substance is fixed, and which has a smaller thickness than the first metal film are formed.