The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Aug. 27, 2014
Kawasaki Jukogyo Kabushiki Kaisha, Kobe-shi, Hyogo, JP;
Toshihiro Yamaoka, Nagoya, JP;
KAWASAKI JUKOGYO KABUSHIKI KAISHA, Kobe-shi, JP;
Abstract
An ultrasonic device includes: a first and second flaw detection head; a moving mechanism that causes the first flaw detection head and the second flaw detection head to perform scanning; a calibration area in which a calibration standard sample is disposed; a flaw detection area in which an inspection object is disposed; and a controller that performs a first calibration process or a second calibration process, the first calibration process being a process of causing the first flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample, the second calibration process being a process of causing the second flaw detection head to scan the calibration standard sample to perform calibration using the calibration standard sample when performing a first flaw detection process of performing ultrasonic flaw detection inspection of the inspection object by the first flaw detection head.